Scaling of the Thue-Morse diffraction measure

Scaling of the Thue-Morse diffraction measure
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Thue-Morse 衍射测量的缩放

DOI:
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发表时间:
2013
期刊:
影响因子:
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通讯作者:
J. Nilsson
J. Nilsson
中科院分区:
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文献类型:
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作者:
M. Baake;U. Grimm;J. Nilsson

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我们重新审视著名的和大量研究的Riesz产品表示的Thue-Morse衍射措施,这也是最大的频谱措施,相应的动力学谱的补充纯点部分。总结了已知的标度关系,并解释了一些新的发现。
We revisit the well-known and much studied Riesz product representation of the Thue-Morse diffraction measure, which is also the maximal spectral measure for the corresponding dynamical spectrum in the complement of the pure point part. The known scaling relations are summarised, and some new findings are explained.