Scaling of the Thue-Morse diffraction measure
Scaling of the Thue-Morse diffraction measure
复制标题
Thue-Morse 衍射测量的缩放
DOI:
--
复制
发表时间:
2013
期刊:
影响因子:
--
通讯作者:
J. Nilsson
中科院分区:
文献类型:
--
作者:
M. Baake;U. Grimm;J. Nilsson
We revisit the well-known and much studied Riesz product representation of the Thue-Morse diffraction measure, which is also the maximal spectral measure for the corresponding dynamical spectrum in the complement of the pure point part. The known scaling relations are summarised, and some new findings are explained.