Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers
Monte Carlo simulation of scanning electron microscopy bright contrast images of suspended carbon nanofibers
复制标题
悬浮碳纳米纤维扫描电子显微镜亮对比度图像的蒙特卡罗模拟
DOI：
10.1063/1.2450655
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发表时间：
2007
影响因子：
4
通讯作者：
Cary Y. Yang
中科院分区：
文献类型：
--
作者：
Makoto Suzuki;Toshishige Yamada;Cary Y. Yang
The authors present a Monte Carlo study of previously observed bright contrast from carbon nanofibers suspended over the underlying substrate using scanning electron microscopy (SEM). The analysis shows that the origin of the bright contrast is mainly the increase in the secondary electron signal from the substrate when a gap between the nanofiber and substrate exists. The SEM signal dependence on the gap height is well reproduced by Monte Carlo simulation as well as a derived analytical expression. The bright contrast prevails when the SEM beam size is much smaller than the nanofiber diameter.
