Image estimation for structured-illumination microscopy

Image estimation for structured-illumination microscopy
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DOI:
10.1117/12.602633
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发表时间:
2005-03
期刊:
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通讯作者:
J. Conchello
J. Conchello
中科院分区:
其他
文献类型:
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作者:
J. Conchello

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当用光学切片显微镜方法记录三维(3D)图像时,每个光学切片包含聚焦信息和离焦贡献,从而模糊了聚焦细节并降低了对比度。有几种方法可以去除或防止来自光学部分堆叠的离焦贡献。一种这样的方法是图像估计-使用基于显微镜的数学描述的计算机程序来消除焦外影响。另一种方法是使用结构照明和简单的算术运算来获得其中离焦贡献大大减少的图像。我们推导了一种使用从结构照明显微镜收集的图像进行图像估计的方法。与使用简单算术公式的结构照明相比,该方法提高了小细节的分辨率。
When recording three-dimensional (3D) images by the method of optical sectioning microscopy, each optical section contains the in-focus information plus out-of-focus contributions that obscure the in-focus detail and reduce contrast. There are several methods to remove or prevent the out-of-focus contributions from the stack of optical sections. One such method is image estimation -the use of a computer program based on a mathematical description of the microscope to remove the out-of-focus contributions. Another method is the use of structured illumination and a simple arithmetic operation to obtain a image that in which the out-of-focus contributions are greatly reduced. We derived a method for image estimation that uses the images collected from the structured-illumination microscope. The method improves the resolution of small detail over that possible with the structured illumination using the simple arithmetic formula.