Indexation of electron diffraction patterns at grain boundaries

Indexation of electron diffraction patterns at grain boundaries
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晶界处电子衍射图案的指数化

DOI:
10.1016/j.matchar.2021.111553
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发表时间:
2021-10
影响因子:
4.7
通讯作者:
Stéphane Roux
Stéphane Roux
中科院分区:
材料科学1区
文献类型:
--
作者:
Qiwei Shi;Ying Zhou;Hongru Zhong;Dominique Loisnard;Chengyi Dan;Fengguo Zhang;Zhe Chen;Haowei Wang;Stéphane Roux

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晶界在材料科学中起着至关重要的作用,人们通过实验和数值方法对晶界进行了广泛的研究。电子背散射衍射(EBSD)通常被用来表征晶体材料,但其性能往往在晶界上受到影响。关键的困难是对重叠的电子背向散射图案进行索引,其中来自多个晶体取向的菊池带共存。霍夫索引在处理重叠的EBSP时经常失败,而最近提出的词典索引和球面索引只给出了重叠模式中的一个三元组的欧拉角。对于所有这些方法,重叠EBSP的定向分度精度都会下降。在这里,我们提出了一种集成的数字图像相关(DIC)方法,通过配准重叠的EBSP和母图来同时精确地确定多个晶体取向。还给出了各晶体取向对重叠图案的贡献率。通过一个三点附近的实验EBSD数据集,展示了该方法丰富的结果的多种好处,如细化晶界、揭示EBSD扫描误差和量化EBSD的空间分辨率。在晶界处,两种指标性晶体取向的测量不确定度均为0.03∘,晶内相同量级,其不确定度贡献率约为0.02。
Grain boundaries play a vital role in materials science, and they are extensively studied through experimental and numerical methods. Electron backscatter diffraction (EBSD) is commonly used to characterize crystalline materials, yet its performance is often compromised at grain boundaries. The key difficulty is to index the overlapped electron backscatter patterns, where Kikuchi bands from multiple crystal orientations coexist. Hough-indexation often fails in treating overlapped EBSP, while the recently proposed dictionary indexation and sphere indexation give only one triplet of Euler angles from overlapped patterns. For all these methods, the orientation indexing precision drops for overlapped EBSP. Here we propose anintegratedDigital Image Correlation (DIC) procedure to determine simultaneously and precisely multiple crystal orientations by registering the overlapped EBSP and the master pattern. The contribution ratio of each crystal orientation to the overlapped pattern is also available. Through an experimental EBSD dataset around a triple point, multiple benefits of the rich results from the method are demonstrated, such as refining grain boundaries, revealing EBSD scan errors and quantifying spatial resolution of EBSD. At the grain boundaries, the crystal orientation measurement uncertainty is 0.03∘for both indexed crystal orientations, the same order for grain interiors, while their contribution ratios of uncertainty around 0.02 are obtained.
DOI: 10.1017/s1431927616012769
发表时间: 2017-02
影响因子: 2.8
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