High resolution X-ray tomography applied in the observation of the micro-structure of materials
High resolution X-ray tomography applied in the observation of the micro-structure of materials
复制标题
高分辨率X射线断层扫描在材料微观结构观察中的应用
DOI：
--
复制
发表时间：
2002
期刊：
影响因子：
--
通讯作者：
U. Zesch
中科院分区：
文献类型：
--
作者：
E. Maire;J. Buffière;P. Cloetens;W. Ludwig;G. Peix;U. Zesch
论文第一部分介绍了层析成像技术的原理。然后展示了一些可用于获得中分辨率(10μm)和高分辨率(1μm)的三维无损图像的设置。论文的第二部分致力于说明该技术在材料科学领域的应用。3D图像可以以定性的方式使用。给出了金属泡沫的中等分辨率和球形颗粒增强的金属基复合材料模型的例子。给出了铝合金的高分辨率计算实例。对于低吸水性材料，我们表明，利用同步辐射获得的相位对比度也可以提供一个有价值的解决方案。最后，我们描述了这些图像在与原位拉伸测试相结合时的定量使用，或者用于简单地分析几种结构材料的初始微结构。
The first part of the paper describes the principle of the tomography technique. It then shows some setups which can be used to obtain medium (10 μm) and high (1 μm) resolution three dimensional non destructive images. The second part of the paper is devoted to illustrations of the use of that technique in the field of materials science. The 3D images can be used in a qualitative manner. Examples are given for medium resolution with metallic foams and model metal matrix composites reinforced with spherical particles. High resolution examples are given for aluminum alloys. For low-absorbent materials, we show that the phase contrast obtained by using the synchrotron radiation can also provide a valuable solution. Finally, we describe the quantitative use of these images when coupled with an in-situ tensile test, or for the simple analysis of the initial microstructure of several structural materials.