Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry.
Gas Cluster Ion Beams for Secondary Ion Mass Spectrometry.
复制标题
用于二次离子质谱分析的气体团簇离子束。
DOI：
10.1146/annurev-anchem-061516-045249
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发表时间：
2018
影响因子：
8
通讯作者：
N. Winograd
中科院分区：
文献类型：
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作者：
N. Winograd
气体团簇离子束（GCIBs）为二次离子质谱（西姆斯）的生物成像和分子深度分析提供了新的机会。这些束由包含数千个粒子的簇组成，以高产率和最小的碎片启动靶分子的解吸。这篇评论强调了实施这些来源的独特机会，特别是生物成像应用。簇离子/固体相互作用的理论方面的开发，以最大限度地提高成功的质谱条件。此外，还回顾了GCIB如何成为实用实验室工具的历史。特别强调的是放在这些源的多功能性，大小，动能，和化学成分可以很容易地改变，以最大限度地提高横向分辨率，希望小于1微米，并最大限度地提高电离效率。生物成像应用的最新例子也被提出。
Gas cluster ion beams (GCIBs) provide new opportunities for bioimaging and molecular depth profiling with secondary ion mass spectrometry (SIMS). These beams, consisting of clusters containing thousands of particles, initiate desorption of target molecules with high yield and minimal fragmentation. This review emphasizes the unique opportunities for implementing these sources, especially for bioimaging applications. Theoretical aspects of the cluster ion/solid interaction are developed to maximize conditions for successful mass spectrometry. In addition, the history of how GCIBs have become practical laboratory tools is reviewed. Special emphasis is placed on the versatility of these sources, as size, kinetic energy, and chemical composition can be varied easily to maximize lateral resolution, hopefully to less than 1 micron, and to maximize ionization efficiency. Recent examples of bioimaging applications are also presented.