Laser-induced damage in deuterated potassium dihydrogen phosphate

Laser-induced damage in deuterated potassium dihydrogen phosphate
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DOI:
10.1364/ao.42.005483
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发表时间:
2003-09-20
期刊:
影响因子:
1.9
通讯作者:
Hawley-Fedder, RA
Hawley-Fedder, RA
中科院分区:
工程技术4区
文献类型:
--
作者:
Burnham, AK;Runkel, M;Hawley-Fedder, RA

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激光诱导的针尖在351 nm的氘代磷酸二氢钾的体损伤取决于相对于晶轴的传播方向和生长温度,除了先前报道的依赖于连续过滤。脉冲长度缩放也与先前的报告一致。导致精确损伤的主要假设是吸收纳米颗粒杂质,我们的结果与该模型一致,但不是结论性的。技术的进步大大提高了抗损伤能力。(C)2003年美国光学学会。
Laser-induced pinpoint bulk damage of deuterated potassium dihydrogen phosphate at 351 nm is shown to depend on the propagation direction relative to the crystallographic axes and on growth temperature in addition to the previously reported dependence on continuous filtration. Pulse-length scaling is also consistent with earlier reports. The leading hypothesis for the cause of pinpoint damage is absorbing nanoparticle impurities, and our results are consistent with but not conclusive for that model. Advances in technology have led to greatly improved damage resistance. (C) 2003 Optical Society of America.