Probing charge density in materials with atomic resolution in real space
Probing charge density in materials with atomic resolution in real space
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DOI：
10.1038/s42254-022-00541-4
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发表时间：
2022-12
影响因子：
38.5
通讯作者：
Christopher Addiego;Wenpei Gao;H. Huyan;Xiaoqing Pan
中科院分区：
文献类型：
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作者：
Christopher Addiego;Wenpei Gao;H. Huyan;Xiaoqing Pan
纳米级材料中的电荷分布通常可以解释宏观性质的起源，如局部电导率或等离子体响应，并阐明微观结构中更基本的变化，如化学键特性的变化。以前，具有高空间分辨率的电荷密度的直接可视化通常是形成结构-性能关系的缺失环节，特别是在非均相材料系统中。然而，最近显微镜技术的进步使研究人员能够将材料中的电荷分布可视化到亚原子长度尺度。在这篇技术评论中，我们讨论了利用衍射技术和电子显微镜在高分辨率真实空间电荷分布成像方面的进展，重点介绍了四维扫描透射电子显微镜、电子全息成像和材料界面应用的最新进展。
The charge distribution in materials at the nanoscale can often explain the origin of macroscopic properties such as localized conductivity or the plasmonic response and illuminate more fundamental changes in the microscopic structure such as changes in chemical bonding characteristics. Previously, direct visualization of the charge density with high spatial resolution was often a missing link in the formation of structure–property relationships, especially in heterogeneous materials systems. However, recent advancements in microscopy technology have enabled researchers to visualize the charge distribution in materials down to subatomic length scales. In this Technical Review, we discuss the developments in high-resolution real-space charge distribution imaging using diffraction techniques and electron microscopy, with a focus on the recent advancement of four-dimensional scanning transmission electron microscopy, electron holography, and applications to materials interfaces.