A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits
A combination of FD-TD and Prony's methods for analyzing microwave integrated circuits
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DOI：
10.1109/mwsym.1991.147179
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发表时间：
1991
期刊：
影响因子：
--
通讯作者：
W. Ko;R. Mittra
中科院分区：
文献类型：
--
作者：
W. Ko;R. Mittra
结果表明，在应用FD-TD技术分析微波集成电路时，用Prony方法可以从较短的FD-TD时间记录外推得到精确的频域散射参数所需的长FD-TD时间记录。与直接生成FD-TD的结果比较表明，使用FD-TD和Prony方法相结合的方法具有相同的精度，而计算时间记录的时间要短得多。
It is demonstrated that, in applying the FD-TD (finite-difference time-domain) technique to analyze microwave integrated circuits, the long FD-TD time record required for generating accurate frequency-domain scattering parameters can be extrapolated from a relatively short FD-TD time record by using Prony's method. As shown by comparison with the direct FD-TD generated results, the approach using the combination of FD-TD and Prony's methods achieves the same accuracy with a time record computed over a much shorter time.>