Analysis of residual gas by high-resolution mass spectrometry during helium glow discharge cleaning in JT-60U
Analysis of residual gas by high-resolution mass spectrometry during helium glow discharge cleaning in JT-60U
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DOI：
10.1016/j.fusengdes.2009.02.001
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发表时间：
2009-06
影响因子：
5.2
通讯作者：
Takao Hayashi;A. Kaminaga;T. Arai;M. Sato
中科院分区：
文献类型：
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作者：
Takao Hayashi;A. Kaminaga;T. Arai;M. Sato
为了考察氦辉放电清洗(He-GDC)的效果，用高分辨质谱仪对JT-60U上的残气进行了分析。残余气体分析仪能够区分He-GDC过程中的D2峰和He峰。He-GDC启动后，D2气体分压随时间增加，达到最高压力(3.80×10~(-4)−)，约为He-GDC启动前的10倍。在He-GDC期间(7h)释放的D2总量被评估为4.4Pam3。He-GDC处理后的D2压强明显低于He-GDC处理前，说明He-GDC能有效地去除面对等离子体的组元中的氚。
The residual gas analysis has been conducted by high-resolution mass spectrometry in JT-60U in order to investigate the effect of helium glow discharge cleaning (He-GDC). The residual gas analyzer was able to distinguish between D2and He peaks during He-GDC. Since the He-GDC started, the partial pressure of D2gas increases with time and reached its highest pressure (3.8×10−4Pa), which was about ten times larger than that before He-GDC. The total amount of D2, which was released during the He-GDC (7h), was evaluated as 4.4Pam3. The pressure of D2after He-GDC was significantly lower than before He-GDC, which indicates that the He-GDC is effective to remove the deuterium from plasma facing components.