Thermally activated decay channels of superhot C60-: delayed electron emission and dissociative attachment studied by hyperthermal negative surface ionization
Thermally activated decay channels of superhot C60-: delayed electron emission and dissociative attachment studied by hyperthermal negative surface ionization
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超热 C60- 的热激活衰变通道:通过高温负表面电离研究延迟电子发射和解离附着
DOI:
10.1016/s1387-3806(98)14194-5
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发表时间:
1999
影响因子:
1.8
通讯作者:
E. Kolodney
中科院分区:
文献类型:
--
作者:
A. Bekkerman;B. Tsipinyuk;E. Kolodney