Improvement of the Crystal Orientation and Surface Roughness of Ru Thin Films by Introducing Oxygen during Sputtering

Improvement of the Crystal Orientation and Surface Roughness of Ru Thin Films by Introducing Oxygen during Sputtering
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溅射过程中引入氧气改善Ru薄膜的晶体取向和表面粗糙度

DOI:
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发表时间:
2004
期刊:
Japanese Journal of Applied Physics Vol43, No.1
影响因子:
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通讯作者:
K.Maekawa
K.Maekawa
中科院分区:
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文献类型:
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作者:
Y.Abe;S.Shinkai;K.Sasaki;J.Yan;K.Maekawa

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