Micro-MOKE with optical interference in the study of 2D Cr2Ge2Te6 nanoflake based magnetic heterostructures
Micro-MOKE with optical interference in the study of 2D Cr2Ge2Te6 nanoflake based magnetic heterostructures
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Micro-MOKE 与光学干涉研究二维 Cr2Ge2Te6 纳米片磁性异质结构
DOI：
10.1063/1.5126944
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发表时间：
2019-12-01
期刊：
影响因子：
1.6
通讯作者：
Sheng, Zhigao
中科院分区：
文献类型：
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作者：
Ma, Zongwei;Zhu, Wang;Sheng, Zhigao
显微磁光克尔效应（micro-MOKE）技术由于其高灵敏度和亚微米空间分辨率，在二维磁性材料和异质结构的研究中得到了广泛的应用。在这里，通过采取2D Cr2 Ge 2 Te 6纳米片的硅晶片衬底作为一个模型系统，我们提出了在这样的系统中的有效的微MOKE测量的光学多层干涉引起的“光学伪影”的效果。研究发现，随着Cr2 Ge 2 Te 6纳米片厚度或探测光波长的变化，“光学伪影”不仅可以调制微MOKE信号的幅度，而且可以调制其符号。基于多层膜干涉模型的详细分析表明，MOKE信号存在符号反转和幅度调制两种行为，并且干涉效应对MOKE响应的影响可以很容易地从非偏振光学图像中预测出来。由于显微磁光克尔效应（micro-MOKE）技术具有高灵敏度和亚微米空间分辨率，在二维磁性材料和异质结构的研究中得到了广泛的应用。在这里，通过采取2D Cr2 Ge 2 Te 6纳米片的硅晶片衬底作为一个模型系统，我们提出了在这样的系统中的有效的微MOKE测量的光学多层干涉引起的“光学伪影”的效果。研究发现，随着Cr2 Ge 2 Te 6纳米片厚度或探测光波长的变化，“光学伪影”不仅可以调制微MOKE信号的幅度，而且可以调制其符号。基于多层膜干涉模型的详细分析表明，MOKE信号存在符号反转和幅度调制两种行为，并且干涉效应对MOKE响应的影响可以很容易地从非偏振光学图像中预测出来。我们的研究结果提供了指导原则的促进…
Due to its high sensitivity and sub-micrometer spatial resolution, the microscopic magneto-optical Kerr effect (micro-MOKE) technique has been widely utilized in the study of two-dimensional (2D) magnetic materials and heterostructures. Here, by taking 2D Cr2Ge2Te6 nanoflakes on a silicon wafer substrate as a model system, we present the effect of optical multilayer interference induced “optical artifacts” on the effective micro-MOKE measurements in such a system. It is found that not only the magnitude but also the sign of the micro-MOKE signal could be modulated by the “optical artifacts” with the variation of either the Cr2Ge2Te6 nanoflakes’ thickness or probe light wavelength. The detailed analysis based on the multilayer interference model reveals that there are two kinds of MOKE signals, sign reversal and magnitude modulation behavior, and the interference effect on the MOKE response can be easily predicted from unpolarized optical images. Our findings provide instructional principles on the promotion of micro-MOKE characterization as well as the optical studies in van der Waals magnets.Due to its high sensitivity and sub-micrometer spatial resolution, the microscopic magneto-optical Kerr effect (micro-MOKE) technique has been widely utilized in the study of two-dimensional (2D) magnetic materials and heterostructures. Here, by taking 2D Cr2Ge2Te6 nanoflakes on a silicon wafer substrate as a model system, we present the effect of optical multilayer interference induced “optical artifacts” on the effective micro-MOKE measurements in such a system. It is found that not only the magnitude but also the sign of the micro-MOKE signal could be modulated by the “optical artifacts” with the variation of either the Cr2Ge2Te6 nanoflakes’ thickness or probe light wavelength. The detailed analysis based on the multilayer interference model reveals that there are two kinds of MOKE signals, sign reversal and magnitude modulation behavior, and the interference effect on the MOKE response can be easily predicted from unpolarized optical images. Our findings provide instructional principles on the promoti...