Enhancing Raman signals with an interferometrically controlled AFM tip
Enhancing Raman signals with an interferometrically controlled AFM tip
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DOI：
10.1088/0957-4484/24/41/415701
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发表时间：
2013-10-18
期刊：
影响因子：
3.5
通讯作者：
Krupke, Ralph
中科院分区：
文献类型：
--
作者：
Oron-Carl, Matti;Krupke, Ralph
通过将干涉测量控制的原子力显微镜集成到现有立式显微镜的基础上，我们展示了商业共焦拉曼显微镜升级为尖端增强型拉曼显微镜/光谱系统(TERS)，以提供近场检测和信号增强。通过测量PEDOT：PSS薄膜和碳纳米管的拉曼近场增强效应，验证了该系统的可行性。观测到的增强倍数分别为2-3和5-6。此外，在纳米管装置上，我们显示了局部电导测量及其与拉曼和地形记录的关联。以演示的方式升级现有的直立式共聚焦拉曼显微镜比购买完整的商业TERS系统要便宜得多。
We demonstrate the upgrade of a commercial confocal Raman microscope into a tip-enhanced Raman microscope/spectroscopy system (TERS) by integrating an interferometrically controlled atomic force microscope into the base of an existing upright microscope to provide near-field detection and thus signal enhancement. The feasibility of the system is demonstrated by measuring the Raman near-field enhancement on thin PEDOT: PSS films and on carbon nanotubes within a device geometry. An enhancement factor of 2-3 and of 5-6 is observed, respectively. Moreover, on a nanotube device we show local conductivity measurement and its correlation to Raman and topography recordings. Upgrading an existing upright confocal Raman microscope in the demonstrated way is significantly cheaper than purchasing a complete commercial TERS system.