X-ray backscattering study of crystal lattice distortion in hidden order of URu2Si2
X-ray backscattering study of crystal lattice distortion in hidden order of URu2Si2
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DOI：
10.1080/14786435.2014.952701
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发表时间：
2014-11
影响因子：
1.6
通讯作者：
C. Tabata;T. Inami;S. Michimura;M. Yokoyama;H. Hidaka;Tatsuya Yanagisawa;H. Amitsuka
中科院分区：
文献类型：
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作者：
C. Tabata;T. Inami;S. Michimura;M. Yokoyama;H. Hidaka;Tatsuya Yanagisawa;H. Amitsuka
我们用同步辐射X射线衍射法测量了一个尺寸约为的小单晶。后向散射衍射装置（2）与Si（6 6 0）单色器组合确保了高仪器分辨率，其中表示晶格平面间距，并且其扩展表示为半峰全宽（FWHM）。在5 ~ 25 K温度范围内，我们仔细测量了（550）布拉格峰，发现当“隐藏序”（HO）在17.5K以下时，它没有表现出展宽和分裂的特征。峰位置的温度变化密切遵循已知线性热膨胀系数的行为。对峰宽的详细分析表明，在正交性的实验精度范围内，HO的四重旋转对称性是守恒的。我们还发现，（5 5 0）峰形表现出与温度无关的精细结构，这表明所用晶体的四轴晶格参数分布的半高宽为。
We performed synchrotron X-ray diffraction measurements on a small single crystal of with approximate dimensions of . A backscattering diffraction set-up (2) in combination with a Si(6 6 0) monochromator ensures a high instrumental resolution of , where denotes a lattice-plane spacing and is its spread expressed as the full width at half maximum (FWHM). We carefully measured the (5 5 0) Bragg peak in the temperature range between 5 and 25 K, and found it to show no signature of broadening and splitting when “Hidden Order (HO)” sets in below 17.5 K. Temperature variation of the peak position closely follows the behaviour of the known linear thermal expansion coefficient. Detailed analysis of the peak width reveals that the tetragonal fourfold rotational symmetry of is conserved in HO within the experimental accuracy of the orthorhombicity of . We also found that the (5 5 0) peak profile exhibits a temperature-independent fine structure, which indicates that the tetragonal -axis lattice parameter of the used crystal is distributed with a FWHM of .