Electronic speckle pattern interferometry based on spatial fringe analysis method using two cameras
Electronic speckle pattern interferometry based on spatial fringe analysis method using two cameras
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DOI：
10.1080/09500340701433167
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发表时间：
2008-01
影响因子：
1.3
通讯作者：
Y. Arai;Hiroyuki Hira;S. Yokozeki
中科院分区：
文献类型：
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作者：
Y. Arai;Hiroyuki Hira;S. Yokozeki
为了实现高分辨率、高速度、大变形的测量，将空间相移法应用于多摄像机技术，提出了一种新的散斑测量方法。实验证明，该方法的光学系统仅使用两个摄像机，因此光学元件的对准比普通的多摄像机方法更容易。实验结果表明了该方法原理的正确性。结果表明，在小变形测量中，该方法的测量精度约为1/50波长。此外，通过累积小的连续变形测量的结果，该方法被改进为大变形测量方法。为了检测物体大变形的相位图，提出了物体大变形的最佳采样过程。实验证明，该方法可以精确测量大变形。
A new speckle measurement method is proposed by applying a spatial phase shifting method to multi-camera technology in order to perform a high resolution, high speed, and large deformation measurement. It is confirmed that the alignment of optical elements in this method is easier than the ordinary multi-camera methods because the optical system uses only two cameras. The validity of principle of the method is discussed by the results of experiments. It is shown that measurement precision of this method is about 1/50 wavelength in a small deformation measurement. Furthermore, the method is improved for a large deformation measurement method by accumulating the results of the small continuous deformation measurement. The optimum sampling process of the large deformation of an object is proposed in order to detect the phase map of the large deformation. It is confirmed that the large deformation can be precisely measured by this method.