Design of Microwave Calibration Standards for Characterising S-Parameters of Quantum Integrated Circuits at Millikelvin Temperatures
Design of Microwave Calibration Standards for Characterising S-Parameters of Quantum Integrated Circuits at Millikelvin Temperatures
复制标题
用于表征毫开尔文温度下量子集成电路 S 参数的微波校准标准的设计
DOI：
--
复制
发表时间：
2022
期刊：
影响因子：
--
通讯作者：
N. Ridler
中科院分区：
文献类型：
--
作者：
M. Stanley;S. D. de Graaf;T. Lindström;M. Salter;J. Skinner;N. Ridler
在量子信息科学领域，超导量子集成电路在稀释冰箱内以毫微秒的温度工作。这种非连接器件的微波性能可以通过测量其校准的S参数来表征。高质量微波标准的设计是实现准确定标的关键。在这项工作中，我们描述了一种用于毫微电子温度下的全双端口S参数测量装置的结构，以及微波校准单元。介绍了毫克尔文温度下校准装置中使用的标准的设计，并用电磁模拟和测量进行了验证。通过将商用衰减器描述为测试设备来验证标准的适用性。
In the field of quantum information science, superconducting quantum integrated circuits are operated at millikelvin temperatures inside dilution refrigerators. The microwave performance of such non-connectorised devices can be characterised by measuring their calibrated S-parameters. The design of high-quality microwave standards is essential to achieve accurate calibration. In this work we describe the architecture of a full 2-port S-parameter measurement set-up for use at millikelvin temperatures along with the microwave calibration unit. The design of the standards for use in the calibration unit at millikelvin temperatures is described and verified using electromagnetic simulation and measurements. The suitability of the standards is verified by characterising a commercial attenuator as a test device.