Cryo-EM with sub-1 Å specimen movement
Cryo-EM with sub-1 Å specimen movement
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DOI：
10.1126/science.abb7927
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发表时间：
2020-10-09
期刊：
影响因子：
56.9
通讯作者：
Russo, Christopher J.
中科院分区：
文献类型：
--
作者：
Naydenova, Katerina;Jia, Peipei;Russo, Christopher J.
低温电子显微镜（cryo-EM）的大部分信息丢失源于成像过程中的粒子运动，这一点仍然知之甚少。我们表明，这种运动是由悬浮冰的屈曲和随后的变形引起的，其阈值直接取决于支撑箔设置的冻结水层的形状。我们描述了一种试样支撑设计，消除了屈曲，并将电子束诱导的粒子运动减少到小于1埃。该设计允许在高速探测器成像过程中精确跟踪箔片，从而减少对低温精度和稳定性的要求。它包括最大的孔密度，这增加了自动低温电镜的吞吐量，而不会降低数据质量。无运动成像允许外推到样品在零电子暴露的三维地图，在辐射损伤开始之前。
Most information loss in cryogenic electron microscopy (cryo-EM) stems from particle movement during imaging, which remains poorly understood. We show that this movement is caused by buckling and subsequent deformation of the suspended ice, with a threshold that depends directly on the shape of the frozen water layer set by the support foil. We describe a specimen support design that eliminates buckling and reduces electron beam-induced particle movement to less than 1 angstrom. The design allows precise foil tracking during imaging with high-speed detectors, thereby lessening demands on cryostage precision and stability. It includes a maximal density of holes, which increases throughput in automated cryo-EM without degrading data quality. Movement-free imaging allows extrapolation to a three-dimensional map of the specimen at zero electron exposure, before the onset of radiation damage.