Correction due to aperture in transmission interference microscopes
Correction due to aperture in transmission interference microscopes
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由于透射干涉显微镜的孔径而进行的校正
DOI：
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发表时间：
1958
期刊：
影响因子：
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通讯作者：
L. Johansson
中科院分区：
文献类型：
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作者：
E. Ingelstam;L. Johansson
在透射干涉显微镜的条纹间距示出需要校正由于倾斜的光线，相对于正常值有效的垂直射线。间距以及相应地测量的路径差t（nx-n 0）小于正常值（与反射显微镜的情况相反）。对不同的冷凝器N.A.值进行了计算。和不同的参数，显示校正高达-15%。当干涉阶数较低时，条纹强度也随干涉阶数的增加而减小。实验证实了这些发现。的效果进行了讨论，在一些一般的想法（x，y）-保真度和（z）-保真度，在有限的光信息通道。
The fringe spacing in transmission interference microscopes is shown to require a correction due to the oblique rays, with respect to the ordinary value valid for perpendicular rays. The spacing, and accordingly the measured path differences, t(nx - n0), are smaller than the normal values (opposite to the case of reflexion microscopes). Calculations are made for different values of condenser N.A. and varied parameters, showing corrections up to - 15%. The fringe intensities also decrease with the order of interference when it is low. Experiments confirm these findings. The effect is discussed in relation to some general ideas of (x, y)-fidelity and (z)-fidelity as obtained in a limited optical information channel.