Crystallinity and surface effects on Young’s modulus of CuO nanowires
Crystallinity and surface effects on Young’s modulus of CuO nanowires
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DOI：
10.1063/1.2723654
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发表时间：
2007-04
影响因子：
4
通讯作者：
E. Tan;Yanwu Zhu;T. Yu;L. Dai;C. Sow;V. Tan;C. Lim
中科院分区：
文献类型：
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作者：
E. Tan;Yanwu Zhu;T. Yu;L. Dai;C. Sow;V. Tan;C. Lim
作者通过使用原子力显微镜进行三点弯曲测试，研究了结晶度和表面对氧化铜 (CuO) 纳米线杨氏模量的影响。获得的纳米线的杨氏模量范围为 70 至 300GPa，并且取决于两个因素。首先，它取决于纳米线是单晶还是多晶，如是否存在非晶表面层所示。其次，两种类型的纳米线的模量随着直径的减小而增加。结合透射电子显微镜和计算模拟研究，阐明了CuO纳米线的纳米结构-力学性能关系。
The authors investigate the crystallinity and surface effects on Young’s modulus of cupric oxide (CuO) nanowires by performing three-point bend test using atomic force microscopy. Young’s modulus of the nanowires obtained ranges from 70to300GPa and is dependent on two factors. Firstly, it depends on whether the nanowire is mono- or polycrystalline, as indicated by the absence or presence of an amorphous surface layer. Second, the modulus increases with decreasing diameter for both types of nanowires. Combined with transmission electron microscopy and computational simulation studies, the nanostructure-mechanical property relationship of CuO nanowires is elucidated.