Imaging of magnetic and electric fields by electron microscopy
Imaging of magnetic and electric fields by electron microscopy
复制标题
通过电子显微镜对磁场和电场进行成像
DOI：
10.1088/0953-8984/28/40/403001
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发表时间：
2016
期刊：
影响因子：
--
通讯作者：
J. Zweck
中科院分区：
文献类型：
--
作者：
J. Zweck
纳米结构材料越来越成为我们日常生活的一部分，部分作为自组装颗粒或人工图案。这些纳米结构通常具有内在的磁场和/或电场，其决定（至少部分地）它们的物理性质。因此，能够在纳米尺度上可靠地测量这些场是很重要的。一个相当常见的工具，为这些领域的调查是透射电子显微镜，因为它提供了高的空间分辨率。使用电子显微镜图像的电场和磁场在微米到亚纳米尺度的详细处理透射电子显微镜（TEM）和扫描透射电子显微镜（STEM）。对比度的形成描述了最常见的成像模式，每种技术的具体优点和缺点进行了讨论，并给出了例子。此外，列出并解释了使用所述技术的实验要求。
Nanostructured materials become more and more a part of our daily life, partly as self-assembled particles or artificially patterned. These nanostructures often possess intrinsic magnetic and/or electric fields which determine (at least partially) their physical properties. Therefore it is important to be able to measure these fields reliably on a nanometre scale. A rather common instrument for the investigation of these fields is the transmission electron microscope as it offers high spatial resolution. The use of an electron microscope to image electric and magnetic fields on a micron down to sub-nanometre scale is treated in detail for transmission electron microscopes (TEM) and scanning transmission electron microscopes (STEM). The formation of contrast is described for the most common imaging modes, the specific advantages and disadvantages of each technique are discussed and examples are given. In addition, the experimental requirements for the use of the techniques described are listed and explained.
影响因子：
2.2
作者：
Krajnak, Matus;McGrouther, Damien;McVitie, Stephen
通讯作者：
McVitie, Stephen
影响因子：
2.2
作者：
MacLaren, Ian;Wang, LiQiu;Dunin-Borkowski, Rafal E.
通讯作者：
Dunin-Borkowski, Rafal E.