EPMA and Quantitative MCs+-SIMS of Metal-DLC Coating Materials

EPMA and Quantitative MCs+-SIMS of Metal-DLC Coating Materials
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金属-DLC 涂层材料的 EPMA 和定量 MC -SIMS

DOI:
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发表时间:
2000
期刊:
影响因子:
5.7
通讯作者:
Ulrike Wischmann
Ulrike Wischmann
中科院分区:
化学2区
文献类型:
--
作者:
P. Willich;Ulrike Wischmann

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摘要:用(WDS)-EPMA和MCs+-西姆斯对金属-类金刚石(DLC)硬质涂层的成分进行了表征。 EPMA可实现精确(± 5%相对)定量分析,包括N、O和Ar的微量浓度(0.1-10 at%)。在“近表面”EPMA(E0 < 10 keV)条件下,表面氧化膜对“纯”金属标准的影响可能是精度方面的限制因素。足够“厚”的层状结构(膜厚≥ 2 μm)的深度剖析是通过沿着机械制备的斜面的EMA线扫描进行的。深度分辨率约为0.2 μm。MCs+-模式下的西姆斯可实现金属-DLC层状结构的高分辨率(< 20 nm)深度分析,包括H(1-20 at%)的测定。MCs+-西姆斯,即采用Cs+一次离子和监测MCs+分子二次离子(M是感兴趣的元素)被认为是一种有前途的途径,达到足够准确的(10-20%)SIMS定量。MC +-西姆斯的与基质无关的相对灵敏度因子源自EPMA定义的均匀涂层材料。EPMA被证明也是有用的,以检测有关的问题,在金属DLC材料中的Ar的西姆斯。结合EPMA-SIMS被证明是一种有效的分析策略,用于工业生产中的质量控制,并支持开发具有最佳摩擦学性能的金属DLC层状结构。
Abstract. Compositional characterization of metal-DLC (metal-containing diamond-like carbon) hard coatings is carried out by (WDS)-EPMA and MCs+-SIMS. EPMA enables accurate (± 5% relative) quantitative analysis including minor concentrations (0.1–10 at%) of N, O and Ar. Under conditions of “near-surface” EPMA (E0 < 10 keV) the influence of surface oxide films on “pure” metal standards may be a limiting factor in respect of accuracy. Depth profiling of sufficiently “thick” layered structures (film thickness ≥ 2 μm) is carried out by EPMA-line scans along mechanically prepared bevels. The depth resolution is about 0.2 μm. SIMS in the MCs+-mode enables high resolution (< 20 nm) depth profiling of metal-DLC layered structures including the determination of H (1–20 at%). MCs+-SIMS, i.e. employing Cs+ primary ions and monitoring MCs+ molecular secondary ions (M is the element of interest) is presented as a promising route towards sufficiently accurate (10–20%) SIMS-quantification. Matrix-independent relative sensitivity factors for MCs+-SIMS are derived from homogeneous coating materials defined by EPMA. EPMA proves to be also useful to detect problems related to SIMS of Ar in metal-DLC materials. The combination EPMA-SIMS is demonstrated as an effective analytical strategy for quality control in industrial production and to support the development of metal DLC layered structures with optimum tribological properties.