Hot-Swapping architecture extension for mitigation of permanent functional unit faults
Hot-Swapping architecture extension for mitigation of permanent functional unit faults
复制标题
热插拔架构扩展可缓解永久性功能单元故障
DOI：
10.1109/fpl.2009.5272428
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发表时间：
2009
期刊：
影响因子：
--
通讯作者：
Yukihiro Nakamura
中科院分区：
文献类型：
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作者：
Z. Rákossy;Masayuki Hiromoto;H. Ochi;Yukihiro Nakamura
由于半导体集成的最新进展，系统变得更容易受到导致暂时或永久故障的故障的影响。我们提出了一个新的架构扩展适合阵列的功能单元，这将提供测试和更换故障单元，而不中断正常的系统操作。该扩展依赖于由热插拔算法控制的数据路径切换，通过使用这些功能单元进行测试，并在必要时用备件替换，确保在备件持续使用的同时永久运行。热插拔功能可以作为一个案例研究添加到一个示例架构中，开销为74- 87%。同时，采用65 nm工艺，制作了工作在166 MHz的4.2mm × 2.1mm的原型芯片。
Due to latest advances in semiconductor integration, systems are becoming more susceptible to faults leading to temporary or permanent failures. We propose a new architecture extension suitable for arrays of functional units, that will provide testing and replacement of faulty units, without interrupting normal system operation. The extension relies on data-path switching controlled by a hot-swapping algorithm, by use of which functional units are tested and replaced by spares if necessary, ensuring permanent operation while the spares last. The Hot-Swapping functionality could be added as a case study on a sample architecture, with an overhead of 74–87%. Also, a prototype chip (4.2mm × 2.1mm) targeted to operate at 166MHz has been fabricated, using 65nm process technology.