Development and Performance Test of Picosecond Pulse X-ray Excited Streak Camera System for Scintillator Characterization
Development and Performance Test of Picosecond Pulse X-ray Excited Streak Camera System for Scintillator Characterization
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DOI：
10.1143/apex.3.056202
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发表时间：
2010-05
影响因子：
2.3
通讯作者：
T. Yanagida;Y. Fujimoto;A. Yoshikawa;Y. Yokota;K. Kamada;J. Pejchal;Varely Chani;N. Kawaguchi;K. Fukuda;K. Uchiyama;Kuniyoshi Mori;Ken Kitano;M. Nikl
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文献类型：
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作者：
T. Yanagida;Y. Fujimoto;A. Yoshikawa;Y. Yokota;K. Kamada;J. Pejchal;Varely Chani;N. Kawaguchi;K. Fukuda;K. Uchiyama;Kuniyoshi Mori;Ken Kitano;M. Nikl
为了观测时间分辨和波长分辨的闪烁事件，研制了皮秒脉冲X射线激发条纹相机系统。波长范围从真空紫外区(VUV)扩展到近红外(110-900 nm)，仪器响应函数约为80ps。本文介绍了该仪器的工作原理和首次使用BaF_2单晶闪烁体进行的性能测试。我们的系统能清晰地探测到BaF2在190 nm和220 nm附近的芯价发光，其衰减时间为0.7 ns。这些结果与文献一致，证实了我们的系统工作正常。
To observe time and wavelength-resolved scintillation events, picosecond pulse X-ray excited streak camera system is developed. The wavelength range spreads from vacuum ultraviolet (VUV) to near infrared region (110–900 nm) and the instrumental response function is around 80 ps. This work describes the principle of the newly developed instrument and the first performance test using BaF2 single crystal scintillator. Core valence luminescence of BaF2 peaking around 190 and 220 nm is clearly detected by our system, and the decay time turned out to be of 0.7 ns. These results are consistent with literature and confirm that our system properly works.