Radiation-induced soft errors in digital circuits - A literature survey
Radiation-induced soft errors in digital circuits - A literature survey
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数字电路中辐射引起的软错误 - 文献调查
DOI：
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发表时间：
2002
期刊：
影响因子：
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通讯作者：
T. Heijmen
中科院分区：
文献类型：
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作者：
T. Heijmen
当前的技术说明概述了海平面上半导体器件软错误率（SER）的可用文献。主要关注SRAM电路，但也考虑其他存储器和逻辑。本文讨论了半导体中电离粒子的辐射源和数据位翻转的物理机制。回顾了软误差建模与仿真的研究成果，总结了软误差的测试方法.讨论了技术缩放对SER的影响。提出了几种技术来提高SER灵敏度的电路设计。该报告包括讨论SER问题对未来几年深亚微米设计的影响。结论：软错误问题在深亚微米设计中越来越重要。如今，这个话题与存储器特别相关，但在不久的将来，它也必须在逻辑设计中得到解决。引起软错误的辐射源是α粒子（来自晶片和封装材料）和宇宙中子。这两种类型的粒子需要各自的测量技术。不同的建模和仿真方法已经在设备和电路级开发。已经提出了几种解决方案来提高器件的SER灵敏度。最后，为了获得足够的可靠性，将有必要采用错误检测和纠正方法。技术缩放增加了总SER和多位错误的百分比。c ©Philips Electronics Nederland BV 2002 iii 2002/828未分类报告iv c ©Philips Electronics Nederland BV 2002未分类报告2002/828
The current technical note gives an overview of the available literature on the soft error rate (SER) of semiconductor devices at sea level. The main focus is on SRAM circuits, but other memories and logic are considered also. The radiation sources causing ionizing particles in semiconductors are discussed and the physical mechanisms of the upset of data bits are treated. Reported work on soft error modeling and simulation is reviewed and test methods are summarized. The impact of technology scaling on SER is discussed. Several techniques are treated that were proposed to improve the SER sensitivity of circuit designs. The report includes a discussion about the impact of the SER issue on deep-submicron design in coming years. Conclusions: The soft error issue is increasingly important in deep-submicron design. Nowadays, the topic is particularly relevant for memories, but in the near future it will also have to be addressed in logic design. The radiation sources inducing soft errors are alpha particles (from wafer and package materials) and cosmic neutrons. The two types of particles require their own measurement techniques. Different modeling and simulation methods have been developed at both the device and the circuit level. Several solutions have been proposed to improve the SER sensitivity of devices. Eventually, the application of error detection and correction methodologies will be necessary to obtain sufficient reliability. Technology scaling increases both the total SER and the percentage of multiple-bit errors. c ©Philips Electronics Nederland BV 2002 iii 2002/828 Unclassified Report iv c ©Philips Electronics Nederland BV 2002 Unclassified Report 2002/828