A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification
A SIFT-based Waveform Clustering Method for aiding analog/mixed-signal IC Verification
复制标题
一种基于 SIFT 的波形聚类方法，用于辅助模拟/混合信号 IC 验证
DOI：
--
复制
发表时间：
2020
期刊：
影响因子：
--
通讯作者：
G. Pelz
中科院分区：
文献类型：
--
作者：
A. Gaita;Georgian Nicolae;E. David;Andi Buzo;C. Burileanu;G. Pelz
提出了一种利用电路响应信号的波形聚类来加速集成电路验证过程的方法。主要目标是自动将信号分成可能显示视觉相似性的不同组，以帮助视觉检查/核实。作为第一步，该方法通过在尺度空间上找到信号的稳定点并计算能够描述其邻域的稳健描述符来提取类SIFT特征。所得到的描述符被量化，以便在聚类过程中用作词袋直方图。我们在一个包含10个电气测试的数千个信号的电路波形数据库上验证了该方法的有效性。
This paper proposes a method for speeding-up the verification process of integrated circuits, featuring waveform clustering of circuit response signals. The main objective is to automatically separate the signals into distinct groups that potentially exhibit visual similarities in order to aid the visual inspection/verification. As a first step, the proposed method extracts SIFT-like features by finding stable points of the signal over the scale space and computing robust descriptors able to describe their neighborhood. The resulted descriptors are quantized in order to be used in the clustering process as bag-of-words histograms. We demonstrate the validity of our method on a circuit waveform database containing several thousands of signals belonging to ten electrical tests.