Pressure Perturbation in EHD Contacts Due to an Ellipsoidal Asperity
Pressure Perturbation in EHD Contacts Due to an Ellipsoidal Asperity
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椭圆体粗糙度导致 EHD 接触中的压力扰动
DOI：
10.1115/1.3452787
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发表时间：
1975
期刊：
影响因子：
--
通讯作者：
H. Cheng
中科院分区：
文献类型：
--
作者：
L. Chow;H. Cheng
在假设微凸体形状不受扰动压力影响的情况下，通过求解扰动Reynolds方程，确定了弹性流体动力学接触入口区域椭圆形微凸体尖端周围的压力波动。结果被呈现为作为椭圆率比，最大赫兹压力，标称EHD膜厚度，微凸体尺寸，微凸体高度和压力粘度系数的函数的扰动压力的振幅。对于光滑表面和静止粗糙体之间的简单滑动的情况，还将大椭圆率比的结果与通过使用先前的二维粗糙体脊的线接触EHD分析[6]获得的压力波动进行了比较。该协议被发现是接近适中的赫兹压力和相对厚的EHD膜厚度。
The pressure fluctuations around an ellipsoidal asperity tip at the inlet region of an elastohydrodynamic contact is determined by solving a perturbed Reynolds equation assuming that the asperity shape is unaffected by the perturbed pressure. Results are presented as the amplitude of the perturbed pressure as a function of ellipticity ratio, maximum Hertzian pressure, nominal EHD film thickness, asperity size, asperity height, and pressure viscosity coefficient. For the case of simple sliding between a smooth surface and a stationary asperity, a comparison is also made between the results for large ellipticity ratios and the pressure fluctuations obtained by using a previous line contact EHD analysis [6] for a two-dimensional asperity ridge. The agreement is found to be close for moderate Hertzian pressure and relatively thick EHD film thickness.