Carbon nanotubes as probes for atomic force microscopy
Carbon nanotubes as probes for atomic force microscopy
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DOI:
10.1088/0957-4484/11/1/301
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发表时间:
2000-03-01
期刊:
影响因子:
3.5
通讯作者:
Hansma, PK
中科院分区:
文献类型:
--
作者:
Stevens, RMD;Frederick, NA;Hansma, PK
Tip-derived artifacts remain one of the chief limitations of atomic force microscopy (AFM) when attempting to measure sub-nanometre structures. Carbon nanotubes represent ideal structures for use as AFM tips because of their small diameter, high aspect ratio and high strength. We attached single carbon nanotube AFM tips using a novel are discharge method. Using these modified tips, we successfully imaged a protein filament found in sponge spicules of Tethya aurantia. We report a modular stave-like structure for the protein filament that was previously unobservable with conventional AFM cantilevers.