In-Situ Observation of the Fabrication Process of a Single Shell Carbon Fullerene Nano-Contact Using Transmission Electron Microscope–Scanning Tunneling Microscope

In-Situ Observation of the Fabrication Process of a Single Shell Carbon Fullerene Nano-Contact Using Transmission Electron Microscope–Scanning Tunneling Microscope
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使用透射电子显微镜-扫描隧道显微镜原位观察单壳碳富勒烯纳米触点的制造过程

DOI:
10.1143/jjap.46.l67
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发表时间:
2007
影响因子:
1.5
通讯作者:
K. Takayanagi
K. Takayanagi
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
Makoto Yoshida;Y. Kurui;Y. Oshima;K. Takayanagi

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由悬浮在两个金电极之间的无定形碳团聚体(a-C团聚体)制备了单壳碳富勒烯(SSF)。当使用透射电子显微镜-扫描隧道显微镜(TEM-STM)系统增加对a-C附聚物施加的偏压时,观察到经由玻璃碳向SSF的转化。结果发现,在高于0.6V的偏置电压下发生SSF转变,而碳原子数量没有明显损失。SSF的大小范围从C60到C620,具有Ih或I对称性。
A single shell carbon fullerene (SSF) was fabricated from an amorphous carbon agglomerate (a-C agglomerate) suspended between two gold electrodes. As the applied bias voltage to the a-C agglomerate was increased using a transmission electron microscope–scanning tunneling microscope (TEM–STM) system, the transformation into the SSF via a glassy carbon was observed. It was found that the SSF transformation occurred above the bias voltage of 0.6 V without a prominent loss of the number of carbon atoms. The size of the SSFs ranged from C60 to C620 having Ih or I symmetry.
DOI: 10.1103/physrevb.72.033414
发表时间: 2005-07-01
期刊: PHYSICAL REVIEW B
影响因子: 3.7
作者:
Kasumov, AY;Tsukagoshi, K;Bouchiat, H
通讯作者: Bouchiat, H