Epitaxial TiC (001) layers: Phase formation and physical properties vs C-to-Ti ratio
Epitaxial TiC (001) layers: Phase formation and physical properties vs C-to-Ti ratio
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外延 TiC (001) 层:相形成和物理性能与 C/Ti 比率
DOI:
10.1016/j.actamat.2022.117643
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发表时间:
2022
期刊:
影响因子:
9.4
通讯作者:
Gall, Daniel
中科院分区:
文献类型:
--
作者:
Fang, Peijiao;Mulligan, C.P.;Jia, Ru;Shi, Jian;Khare, S.V.;Gall, Daniel
Titanium carbide films are deposited onto MgO(001) by reactive magnetron sputtering in Ar/CH4mixtures at 1100 °C with a varying CH4fractionfCH4= 0.4–8%, yielding C-to-Ti ratiosx= 0.08–1.8. The microstructure is dominated by an epitaxial rock-salt structure TiCx(001) matrix which contains secondary hcp Ti and graphitic/a-C:H forx≤ 0.24 andx≥ 1.5, respectively. First-principles calculations indicate negligible interstitial C in the cubic phase, a large equilibrium phase-fieldx= 0.5–1 for the cubic structure which is extended tox< 0.5 by entropic stabilization, and a predicted C-solubility in hcp Ti ofx= 0.06 at 1100 °C. The measured relaxed lattice constant increases fromao= 0.4304 nm for TiC0.5to 0.4325 nm for TiC1.0, in excellent agreement with predictions. However, dao/dxforx< 0.5 andx> 1.0 is much smaller than predicted for C vacancies and interstitials in rock-salt TiCx, respectively, confirming secondary phase formation and indicating a minimumx= 0.46 in the cubic phase. The hardness and elastic modulus of phase-pure TiCx(001) increases fromH =24 GPa andE= 304 GPa for TiC0.5toH= 31 GPa andE= 462 GPa for TiC1.0, which is attributed to an increasing bonding ionicity.HandEdecrease withx< 0.5 andx> 1.0 due to secondary phase softening which is well described by an effective medium with homogenous stress. The electrical resistivities for TiC0.5and TiC1.0are 168 and 83 μΩ cm at 298 K, and 158 and 72 μΩ cm at 77 K, indicating electron scattering at random anion vacancies forx= 0.5 but also dominant defect scattering for stoichiometric TiC1.0.