The new materials science diffractometer STRESS-SPEC at FRM-II
The new materials science diffractometer STRESS-SPEC at FRM-II
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DOI：
10.4028/www.scientific.net/msf.524-525.211
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发表时间：
2006-01-01
期刊：
影响因子：
--
通讯作者：
Noster, U.
中科院分区：
文献类型：
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作者：
Hofmann, M.;Seidl, G. A.;Noster, U.
近年来，随着新材料的开发和新技术中材料和构件的应用，织构和残余应力的直接测量、计算和评价在世界范围内具有重要意义。非破坏性分析相特定的残余应力和纹理只能通过衍射方法。为了满足这些分析技术的发展，FRM-II的新型材料科学衍射仪STRESS-SPEC被设计为凭借其灵活的配置同样适用于织构和残余应力分析。该系统使用三种不同的单色器：Ge（511），弯曲硅（400）和热解石墨（PG），融合了高度灵活的单色器设置。单色器的该范围和从20（M）= 35度到110度改变出射角的可能性允许波长调节，使得可以在类似于90度的20（S）的散射角周围执行测量。这对于优化中子通量和分辨率是很重要的，尤其是对于组件的应力分析，因为在这种情况下，测量体积元素是立方的，并且由于聚焦单色器引起的大的垂直发散不会影响空间分辨率。该仪器现在可用于常规操作，在这里我们将介绍最近的实验和仪器性能的细节。
In response to the development of new materials and the application of materials and components in new technologies the direct measurement, calculation and evaluation of textures and residual stresses has gained worldwide significance in recent years. Non-destructive analysis for phase specific residual stresses and textures is only possible by means of diffraction methods. In order to cater for the development of these analytical techniques the new Materials Science Diffractometer STRESS-SPEC at FRM-II is designed to be equally applied to texture and residual stress analyses by virtue of its flexible configuration. The system compromises a highly flexible monochromator setup using three different monochromators: Ge (511), bent silicon (400) and pyrolitic graphite (PG). This range of monochromators and the possibility to vary the take-off angles from 20(M) = 35 degrees to 110 degrees allows wavelength adjustment such that measurements can be performed around a scattering angle of 20(S) similar to 90 degrees. This is important in order to optimise neutron flux and resolution, especially for stress analysis on components, since the gauge volume element in that case is cubic and large vertical divergences due to focusing monochromators do not affect the spatial resolution.The instrument is now available for routine operation and here we will present details of recent experiments and instrument performance.