Quantum dot enabled thermal imaging of optofluidic devices

Quantum dot enabled thermal imaging of optofluidic devices
复制标题

DOI:
10.1039/c2lc40181a
复制
发表时间:
2012-01-01
期刊:
影响因子:
6.1
通讯作者:
Kar, Ajoy K.
Kar, Ajoy K.
中科院分区:
工程技术1区
文献类型:
--
作者:
Choudhury, Debaditya;Jaque, Daniel;Kar, Ajoy K.

文献摘要

被引文献

相似文献

量子点热成像已用于分析具有单片集成近红外波导的光流控器件内激光引起的热效应的色度依赖性。我们展示了微通道光学局部加热如何发挥重要作用,在片上光学单元操作的背景下不能忽视这一作用。我们还报告了填充碳纳米管等纳米加热颗粒时局部照明微通道的热成像。
Quantum dot thermal imaging has been used to analyse the chromatic dependence of laser-induced thermal effects inside optofluidic devices with monolithically integrated near-infrared waveguides. We demonstrate how microchannel optical local heating plays an important role, which cannot be disregarded within the context of on-chip optical cell manipulation. We also report on the thermal imaging of locally illuminated microchannels when filled with nano-heating particles such as carbon nanotubes.