A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters
A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters
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DOI：
10.1109/jssc.2005.858477
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发表时间：
2005-12-01
影响因子：
5.4
通讯作者：
Furuta, M
中科院分区：
文献类型：
--
作者：
Mase, M;Kawahito, S;Furuta, M
提出了一种采用突发读出多次曝光方法的宽动态范围CMOS图像传感器。在该方法中，在一帧中最多读出四个不同的曝光时间信号。为了实现高速读出，提出了一种具有噪声消除功能的紧凑型循环模数转换器（ADC），并在列上集成了循环ADC阵列。采用0.25 μ m1-poly 4-Metal CMOS图像传感器技术，研制了宽动态范围CMOS图像传感器样机.与单次曝光的情况相比，动态范围最大扩展了1791倍。动态范围为19.8 bit或119 dB。CMOS图像传感器列中集成的12位ADC的DNL为+0.2/-0.8 LSB。
A wide dynamic range CMOS image sensor with a burst readout multiple exposure method is proposed. In this method, maximally four different exposure-time signals are read out in one frame. To achieve the high-speed readout, a compact cyclic analog-to-digital converter (ADC) with noise canceling function is proposed and arrays of the cyclic ADCs are integrated at the column. A prototype wide dynamic range CMOS image sensor has been developed with 0.25-mu m 1-poly 4-metal CMOS image sensor technology. The dynamic range is expanded maximally by a factor of 1791 compared to the case of single exposure. The dynamic range is measured to be 19.8 bit or 119 dB. The 12-bit ADC integrated at the column of the CMOS image sensor has DNL of +0.2/-0.8 LSB.