Cell-aware Production test results from a 32-nm notebook processor
Cell-aware Production test results from a 32-nm notebook processor
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32 纳米笔记本处理器的细胞感知生产测试结果
DOI：
10.1109/test.2012.6401533
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发表时间：
2012
期刊：
影响因子：
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通讯作者：
J. Rajski
中科院分区：
文献类型：
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作者：
F. Hapke;Michael Reese;J. Rivers;A. Over;V. Ravikumar;W. Redemund;Andreas Glowatz;J. Schlöffel;J. Rajski
本文介绍了一种新的方法，可显着改善基于CMO的设计的总体缺陷覆盖范围。我们介绍了面向缺陷的细胞感知（CA）文库表征和模式产生流以及其应用于32 nm技术的1,900个细胞的结果。 CA流使我们能够检测到造成静态，总延迟和小延迟缺陷的细胞内桥并打开。我们提出了一个32 nm笔记本处理器的高量生产测试结果，该处理器应用了CA测试模式，包括在测试800,000个零件后实现的PPM的缺陷率降低。我们还提出了一个失败部分的细胞内诊断和物理衰竭分析结果。
This paper describes a new approach for significantly improving overall defect coverage for CMOS-based designs. We present results from a defect-oriented cell-aware (CA) library characterization and pattern-generation flow and its application to 1,900 cells of a 32-nm technology. The CA flow enabled us to detect cell-internal bridges and opens that caused static, gross-delay, and small-delay defects. We present highvolume production test results from a 32-nm notebook processor to which CA test patterns were applied, including the defect rate reduction in PPM that was achieved after testing 800,000 parts. We also present cell-internal diagnosis and physical failure analysis results from one failing part.