Distributed gain measurements in Er-doped fibers with high resolution and accuracy using an optical frequency domain reflectometer
Distributed gain measurements in Er-doped fibers with high resolution and accuracy using an optical frequency domain reflectometer
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DOI：
10.1109/50.908823
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发表时间：
2000-12-01
影响因子：
4.7
通讯作者：
Gisin, N
中科院分区：
文献类型：
--
作者：
Wegmuller, M;Oberson, P;Gisin, N
对于关键的掺铒光纤放大器（EDFA）设计，例如，在WDM升压放大器中的增益倾斜优化中，有源光纤内的增益分布的知识可以提供有价值的信息。在评估有源光纤中分布增益的不同技术中，光频域反射技术似乎是最有前途的，因为它是一种非破坏性的测量方法，由于其动态范围，分辨率和范围，而且，由于采用相干检测方案，来自ASE或残余泵浦光的背景光被强烈拒绝。使用不同的掺铒光纤具有强烈变化的掺杂水平和限制，我们证明了出色的准确性和再现性的技术。
For critical Erbium-doped fiber amplifier (EDFA) design, e.g., gain tilt optimization in WDM booster amplifiers, knowledge of the gain distribution within the active fiber can present a valuable information. Among the different techniques to evaluate the distributed gain in active fibers, the technique of optical frequency domain reflectometry seems most promising as it is a nondestructive measurement method well matched to the task due to its dynamic range, resolution, and range, Moreover, background light from ASE or residual pump light is strongly rejected due to the coherent detection scheme employed. Using different Erbium-doped fibers with strongly varying doping levels and confinements, we demonstrate the excellent accuracy and reproducibility of the technique.