Statistical model and local binary pattern based texture feature extraction in dual-tree complex wavelet transform domain
Statistical model and local binary pattern based texture feature extraction in dual-tree complex wavelet transform domain
复制标题
双树复小波变换域中基于统计模型和局部二值模式的纹理特征提取
DOI:
10.1007/s11045-017-0474-z
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发表时间:
2017-02
影响因子:
2.5
通讯作者:
Guowei Yang
中科院分区:
文献类型:
--
作者:
Peng Yang;Guowei Yang
This paper presents a new feature extraction method in dual-tree complex wavelet transform domain. Given an input image, we obtain all highpass directional subimages and a set of pyramid lowpass subimages with different resolutions by applying DTCWT decomposition. After that, generalized Gamma densitymodels and local binary pattern are utilized respectively to characterize features of both highpass and lowpass subimages. The two kinds of features are combined for texture classification, and the experimental results on datasets Brodatz, Outex and UMD demonstrate that our proposed method can achieve superior classification accuracy than other state-of-the-art methods.
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