Evaluation of coating thickness by thermal wave imaging: A comparative study of pulsed and lock-in infrared thermography - Part I: Simulation
Evaluation of coating thickness by thermal wave imaging: A comparative study of pulsed and lock-in infrared thermography - Part I: Simulation
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DOI：
10.1016/j.infrared.2017.04.016
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发表时间：
2017-06-01
影响因子：
3.3
通讯作者：
Kim, Wontae
中科院分区：
文献类型：
--
作者：
Shrestha, Ranjit;Kim, Wontae
本文探讨了用热波成像法评价涂层厚度不均匀的可能性。在评价涂层厚度预测精度的基础上，对脉冲热像仪(PT)和锁定热像仪(LIT)进行了对比研究。本研究在ANSYS15中建立了瞬态热有限元模型，按照实验程序分别对PT采用正方形脉冲加热，对LIT采用不同调制频率的正弦加热。记录了热激励表面的响应，并用傅里叶变换进行数据处理，得到了相角。然后将计算的相角与涂层厚度进行了关联。该方法在评估涂层厚度方面显示出潜力，并成功地应用于测量0.1mm0.6 mm的不均匀顶层，其精度分别为0.0003-0.0023 mm和0.0003-0.0067 mm。该仿真模型能够更好地理解PT和LIT，并提供了建立所需的实验设置参数的方法。这也导致了实验配置的优化，从而限制了必要的物理测试数量。(C)2017爱思唯尔B.V.保留所有权利。
This paper investigates the possibilities of evaluating non-uniform coating thickness using thermal wave imaging method. A comparative study of pulsed thermography (PT) and lock-in thermography (LIT) based on evaluating the accuracy of predicted coating thickness is presented. In this study, a transient thermal finite element model was created in ANSYS 15. A single square pulse heating for PT and a sinusoidal heating at different modulation frequencies for LIT were used to stimulate the sample according to the experimental procedures. The response of thermally excited surface was recorded and data processing with Fourier transform was carried out to obtain the phase angle. Then calculated phase angle was correlated with the coating thickness. The method demonstrated potential in the evaluation of coating thickness and was successfully applied to measure the non-uniform top layers ranging from 0.1 mm to 0.6 mm; within an accuracy of 0.0003-0.0023 mm for PT and 0.0003-0.0067 mm for LIT. The simulation model enabled a better understanding of PT and LIT and provided a means of establishing the required experimental set-up parameters. This also led to optimization of experimental configurations, thus limiting the number of physical tests necessary. (C) 2017 Elsevier B.V. All rights reserved.