Silver Growth on AFM Tip Apexes from Silver Nitrate Solutions Triggered by Focused-Ion-Beam Irradiation
Silver Growth on AFM Tip Apexes from Silver Nitrate Solutions Triggered by Focused-Ion-Beam Irradiation
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DOI：
10.1557/adv.2016.415
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发表时间：
2016-05
期刊：
影响因子：
0.8
通讯作者：
M. Nishi;Daisuke Teranishi;Hiroki Itasaka;M. Shimizu;K. Hirao
中科院分区：
文献类型：
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作者：
M. Nishi;Daisuke Teranishi;Hiroki Itasaka;M. Shimizu;K. Hirao
利用我们的区域选择性化学沉积法在市售的硅原子力显微镜探针的顶端直接生长银纳米结构：用聚焦离子束（FIB）照射硅原子力显微镜探针的顶端，然后将FIB照射的AFM探针暴露于纯AgNO_3水溶液中。利用该方法，银纳米结构选择性地生长在尖端顶点上，在该尖端顶点处，响应于FIB照射，天然氧化物层已经被去除。由于硅和溶液之间的费米能的差异，银离子被从硅探针通过FIB照射区域流入溶液的电子还原。生长的银的形貌取决于AgNO_3的浓度和电子的浓度。在硅原子力显微镜探针的顶点上也展示了金纳米花的生长。
Silver nanostructures are directly grown on the apex of commercially available silicon AFM probes using our area-selective electroless deposition: the apex of a silicon AFM probe is irradiated using a focused ion beam (FIB), and then the FIB-irradiated AFM probe is exposed to a pure AgNO_3 aqueous solution. With this method, a silver nanostructure selectively grows on the tip apex where the native oxide layer has been removed in response to FIB irradiation. Silver ions are reduced by the electrons flowing from the silicon probes into the solution through the FIB-irradiated area owing to the difference in Fermi energy between silicon and the solution. The morphology of the growing silver depends on the concentration of both AgNO_3 and the electrons. The growth of a gold nanoflower is also demonstrated on the apex of a silicon AFM probe.