Crystalline and magnetooptical characteristics of (Tb,Bi)3(Fe,Ga)5O12 deposited on (Y,Nd)3Al5O12

Crystalline and magnetooptical characteristics of (Tb,Bi)3(Fe,Ga)5O12 deposited on (Y,Nd)3Al5O12
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DOI：
10.7567/jjap.57.061101
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发表时间：
2018-05
期刊：
Japanese Journal of Applied Physics
影响因子：
1.5
通讯作者：
R. Morimoto;T. Goto;Yuichi Nakamura;P. Lim;H. Uchida;M. Inoue
R. Morimoto;T. Goto;Yuichi Nakamura;P. Lim;H. Uchida;M. Inoue
中科院分区：
物理与天体物理4区
文献类型：
--
作者：
R. Morimoto;T. Goto;Yuichi Nakamura;P. Lim;H. Uchida;M. Inoue

文献摘要

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我们通过脉冲激光沉积在 Nd 取代的 Y3Al5O12 (Nd:YAG) 单晶衬底上制备了 Bi 和 Ga 取代的 Tb3Fe5O12 (BiGa:TIG) 薄膜，并研究了它们的磁、光学和磁光性能。基板温度为 700 °C 时沉积的 BiGa:TIG 薄膜显示出沿薄膜面外方向的易磁化轴以及在 1064 nm 波长下的法拉第旋转角为 900°/cm。通过X射线衍射分析证实了薄膜的外延生长。
We prepared Bi- and Ga-substituted Tb3Fe5O12 (BiGa:TIG) films on a Nd-substituted Y3Al5O12 (Nd:YAG) single crystal substrate by pulsed laser deposition, and investigated their magnetic, optical, and magnetooptical properties. A BiGa:TIG film deposited with a substrate temperature of 700 °C shows the easy axis of magnetization along the out-of-plane direction of the film and the Faraday rotation angle of 900°/cm at a wavelength of 1064 nm. The epitaxial growth of the film is confirmed by X-ray diffraction analysis.