Digital electrostatic electron-beam array lithography
Digital electrostatic electron-beam array lithography
复制标题
数字静电电子束阵列光刻
DOI:
10.1116/1.1520559
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发表时间:
2002
影响因子:
1.4
通讯作者:
A. Melechko
中科院分区:
文献类型:
--
作者:
L. Baylor;D. Lowndes;M. Simpson;C. E. Thomas;M. Guillorn;V. Merkulov;J. H. Whealton;E. D. Ellis;D. Hensley;A. Melechko
A concept for maskless digital electrostatically focused e-beam array direct-write lithography (DEAL) has been developed at Oak Ridge National Laboratory. This concept incorporates a digitally addressable field-emission array (DAFEA) integrated into a logic and control circuit implemented as an integrated circuit. The design goal is for 3 000 000 individually addressable field-emission cathodes with a 4 μm by 8 μm pitch on a single ∼1 cm2 integrated circuit. The DAFEA design includes built-in electrostatic focusing for each emitter with feedback dose-control circuits to drive each emitter for tightly controlled electron delivery. With the electrostatic focusing, an array of ∼460 of these integrated circuits (up to 30 across by ∼23 rows deep) are suspended on a back plane ∼100 μm above a 300 mm semiconductor wafer. This arrangement could lithographically expose an entire 300 mm wafer, with 30 nm pixels, in less than 45 s, with every wafer pixel redundantly illuminated eight times allowing gray-scale edge p...