Quantum nondestructive determination of qubit states in low-Q cavities via single-photon input-output process.
Quantum nondestructive determination of qubit states in low-Q cavities via single-photon input-output process.
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DOI：
10.1364/oe.24.005487
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发表时间：
2016-03
期刊：
影响因子：
3.8
通讯作者：
Hao Yuan;L. Han
中科院分区：
文献类型：
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作者：
Hao Yuan;L. Han
本文提出了一种在两种低Q腔中实现未知单比特态的量子无损检测的有效方案，单面和双面腔QED系统。在色散区，我们证明了单量子比特态的QNDD可以通过检测单光子输入-输出过程中从腔中反射或透射的光子的量子比特态相关相移（QSDPS）来实现。我们的建议可以直接扩展到多量子比特状态的情况。此外，我们的建议的实验可行性进行了分析，在实验演示电路QED系统。我们的方案的显著特点是，我们的方案工作在低Q腔的色散区，并且对腔衰减和原子自发辐射都是鲁棒的。
We present an efficient proposal to realize quantum nondestructive determination (QNDD) of unknown single-qubit states in two types of low-Q cavities, i.e., single-sided and double-sided cavity QED systems. In the dispersive regime, we demonstrate that the QNDD of single-qubit states can be realized by detecting qubit-state-dependent phase shifts (QSDPSs) of the reflected or transmitted photons from the cavity in the single-photon input-output process. Our proposal could be straightforwardly extended to the case of multiple-qubit states. Furthermore, the experimental feasibility of our proposal is also analyzed in experimentally-demonstrated circuit QED systems. The distinct feature of our proposal is that our proposal works in the dispersive regime of low-Q cavities and it is robust to both cavity decay and atomic spontaneous emission.