Uniaxial Stress Dependence and Scaling Behavior of Dynamic Hysteresis Responses in Soft PZT Ceramics
Uniaxial Stress Dependence and Scaling Behavior of Dynamic Hysteresis Responses in Soft PZT Ceramics
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软 PZT 陶瓷中动态磁滞响应的单轴应力依赖性和缩放行为
DOI：
10.1109/isaf.2006.4387827
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发表时间：
2006
期刊：
影响因子：
--
通讯作者：
S. Ananta
中科院分区：
文献类型：
--
作者：
R. Yimnirun;S. Wongsaenmai;Y. Laosiritaworn;S. Ananta
研究了单轴压应力作用下商业软PZT陶瓷的铁电性能和标度行为。在单轴压缩预应力下的陶瓷的铁电性能观察到的应力高达24 MPa，使用压缩计结合修改的Sawyer-Tower电路。结果表明，随着预应力的增加，材料的铁电特性，即电滞回线（P-E）的面积、饱和极化（Psat）、回复极化（Pr）和回线矩形度（Rsq）逐渐减小，而矫顽场（Ec）几乎不受外加应力的影响.应力引起的畴壁运动抑制和非180度铁电畴反转过程是导致这些变化的原因。此外，在一个完整的周期的应力应用后，这些参数的显着减少已被观察到，并归因于应力诱导的减少在高应力下的自发极化的可切换部分。最后，铁电性能的动态行为也被检查，以建立软PZT陶瓷的标度行为。结果表明，块体陶瓷的结垢行为与理论预测和薄膜结垢实验结果略有不同。
The ferroelectric properties under uniaxial compressive pre-stress and scaling behavior of commercial soft PZT ceramics are investigated. The ferroelectric properties under the uniaxial compressive pre-stress of the ceramics are observed at stress up to 24 MPa using a compressometer in conjunction with a modified Sawyer-Tower circuit. The results show that the ferroelectric characteristics, i.e. the area of the ferroelectric hysteresis (P-E) loops, the saturation polarization (Psat), the remanent polarization (Pr), and the loop squareness (Rsq) decrease with increasing compressive pre-stress, while the coercive field (Ec) is virtually unaffected by the applied stress. The stress-induced domain wall motion suppression and non-180deg ferroelectic domain switching processes are responsible for the changes observed. In addition, a significant decrease in those parameters after a full cycle of stress application has been observed and attributed to the stress induced decrease in switchable part of spontaneous polarization at high stress. Finally, the dynamic behavior of the ferroelectric properties is also examined to establish the scaling behavior of the soft PZT ceramics. It has been found that the scaling behavior found for the bulk ceramic differs slightly from the theoretical prediction and that obtained from the experimental investigation on thin-film.