Near-infrared luminescence of erbium doped Ga2O3 films and devices based on silicon: Realization of energy transfer
Near-infrared luminescence of erbium doped Ga2O3 films and devices based on silicon: Realization of energy transfer
复制标题
DOI:
10.1016/j.optmat.2022.112462
复制
发表时间:
2022-07
影响因子:
3.9
通讯作者:
H. Pang;Majun He;Jie Hu;Yuxuan Fan;Huabao Shang;Dongsheng Li;Deren Yang
中科院分区:
文献类型:
--
作者:
H. Pang;Majun He;Jie Hu;Yuxuan Fan;Huabao Shang;Dongsheng Li;Deren Yang
1.54 μm photoluminescence and electroluminescence are achieved from erbium doped Ga2O3films on silicon substrates and corresponding devices fabricated by sputtering, respectively. Efficient energy transfer between Ga2O3and erbium ions is realized in optical pumping, with the energy transfer efficiency of 54.9%. The ∼1.54 μm electroluminescence of erbium ions here is proved to originate from indirect excitation, different from the conventional impact excitation by hot electrons. Herein, the light emitting devices present a turn-on voltage of ∼13 V and onset electric field of 1.4 MV/cm. This work demonstrates the potential of preparing practical electrical-driven silicon-based light sources from erbium doped Ga2O3films.