The offset droplet: a new methodology for studying the solid/water interface using x-ray photoelectron spectroscopy.
The offset droplet: a new methodology for studying the solid/water interface using x-ray photoelectron spectroscopy.
复制标题
偏移液滴：一种使用 X 射线光电子能谱研究固体/水界面的新方法。
DOI：
10.1088/1361-648x/aa8b92
复制
发表时间：
2017
期刊：
影响因子：
--
通讯作者：
Booth SG
中科院分区：
文献类型：
--
作者：
Booth SG
XPS 对固水界面的常规研究具有潜在的革命性，因为这一进展为光电子能谱研究开辟了全新的领域。迄今为止，全世界只有少数几个小组实现了这一点，并且当前的技术对可研究的样本类型有很大的限制。在这里，我们提出了一种新颖且独特灵活的方法来解决该问题。通过将细毛细管引入 NAP-XPS，可以将小液滴注入到样品表面，偏离分析区域几毫米。通过仔细控制液滴尺寸，可以在分析区域建立厚度可控的水层——与大液滴连续。我们展示了真空制备的 TiO 2 (110) 单晶上的固-水界面结果，并证明固/液界面是可寻址的。
The routine study of the solid-water interface by XPS is potentially revolutionary as this development opens up whole new areas of study for photoelectron spectroscopy. To date this has been realised by only a few groups worldwide and current techniques have significant restrictions on the type of samples which can be studied. Here we present a novel and uniquely flexible approach to the problem. By introducing a thin capillary into the NAP-XPS, a small droplet can be injected onto the sample surface, offset from the analysis area by several mm. By careful control of the droplet size a water layer of controllable thickness can be established in the analysis area—continuous with the bulk droplet. We present results from the solid-water interface on a vacuum prepared TiO 2 (110) single crystal and demonstrate that the solid/liquid interface is addressable.