Experimental aspects of dissipation force microscopy
Experimental aspects of dissipation force microscopy
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DOI：
10.1103/physrevb.62.13674
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发表时间：
2000-11-15
影响因子：
3.7
通讯作者：
Meyer, E
中科院分区：
文献类型：
--
作者：
Loppacher, C;Bennewitz, R;Meyer, E
讨论了用大振幅动态力显微镜在原子尺度上测量耗散的实验方面。耗散随距离的变化曲线表明，长距离和短程力都有助于耗散。发现短程贡献的衰减长度与隧穿电流的衰减长度接近。给出了耗散与偏置电压和振荡幅度的关系。讨论了原子尺度上耗散的横向变化；指出了尖端原子结构对定量结果的影响。
Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed; and the role of the atomic constitution of the tip for quantitative results is pointed out.