Exploring neutral atom microscopy
Exploring neutral atom microscopy
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探索中性原子显微镜
DOI：
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发表时间：
2014
期刊：
影响因子：
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通讯作者：
Erik J. Sánchez
中科院分区：
文献类型：
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作者：
P. Witham;Erik J. Sánchez
一种名为中性原子显微镜(NAM)或扫描氦显微镜的新成像方法有望打开一扇独特的窗口，了解第一原子层表面的性质。所使用的热能、非带电原子束允许探索样品而不受高能粒子或电荷的破坏性影响，并且没有由于固体探头尖端的纵横比或形状而造成的地形限制，并且分辨率可能远远好于传统的远场光学显微镜。产生表面成分信息的对比机制早已从原子散射实验中得知，例如通过晶体表面的原子衍射或由于表面粗糙度而产生的对比。这些都是第一次在图像中进行探索。
A new imaging method known as Neutral Atom Microscopy (NAM) or Scanning Helium Microscopy promises to open a unique window to the nature of surfaces at the first atomic layer. The thermal energy, non‐charged beam of atoms used allows exploring samples without the destructive effects of energetic particles or electric charges, in addition to having no topographic limitations due to the aspect ratio or shape of a solid probe tip, and with resolution potentially far better than conventional far‐field optical microscopes. Contrast mechanisms which produce surface composition information have long been known from atomic scattering experiments, such as by atomic diffraction from crystal surfaces or contrast due to surface roughness. These are now being explored in images for the first time.