Effect of insulator sleeve length on soft x-ray emission from a neon-filled plasma focus device
Effect of insulator sleeve length on soft x-ray emission from a neon-filled plasma focus device
复制标题
绝缘体套筒长度对氖填充等离子体聚焦装置软 X 射线发射的影响
DOI：
10.1088/0963-0252/13/4/003
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发表时间：
2004
影响因子：
3.8
通讯作者：
P. Lee
中科院分区：
文献类型：
--
作者：
R. Rawat;T. Zhang;C. Phua;James Then;K. A. Chandra;Xin;A. Patran;P. Lee
在3.3 kJ的联合国大学-国际理论物理中心（UNU-ICTP）等离子体聚焦装置的同轴电极组件的封闭端使用不同长度的绝缘套管，以研究不同填充气体压力的氖的软X射线（SXR）（900-1550 eV）产额。利用多通道二极管X射线光谱仪和CCD针孔成像相机研究了SXR的时间和空间分辨发射特性。在低于6毫巴的压力下，平均SXR产量也被发现增加套管长度从19毫米到22毫米。绝缘套管长度进一步增加到25毫米，但是，降低了SXR产量。在高于6毫巴的压力下，不同长度的绝缘套管的SXR产率几乎相同。联合国大学国际理论物理中心等离子体聚焦设备被认为是最佳的氖SXR生产与22毫米的绝缘套管在4毫巴的填充气体压力，最高的平均产量为8.2焦耳每次拍摄，转换效率约为0.25%。对于该套管长度，即使在2或6毫巴压力下的平均产率也与25 mm套管的最大产率相当。
Insulator sleeves of different lengths were used at the closed end of the coaxial electrode assembly of the 3.3 kJ United Nation University-International Centre for Theoretical Physics (UNU-ICTP) plasma focus device to investigate soft x-ray (SXR) (900–1550 eV) yield for different filling gas pressures of neon. The time and space resolved SXR emission characteristics were investigated using a multi-channel diode x-ray spectrometer and a CCD based pinhole imaging camera. At pressures below 6 mbar, the average SXR yield was also found to increase with increasing sleeve length from 19 to 22 mm. A further increase in insulator sleeve length to 25 mm, however, decreased the SXR yield. At pressures above 6 mbar, the SXR yields were almost the same for insulator sleeves of different lengths. The UNU-ICTP plasma focus device is found to be best optimized for neon SXR production with a 22 mm insulator sleeve at 4 mbar filling gas pressure, with the highest average yield of 8.2 J per shot, for which the conversion efficiency is about 0.25%. For this sleeve length, even the average yield at 2 or 6 mbar pressure was comparable with the maximum yield of a 25 mm sleeve.