Mapping Substrate Surface Field Propagation in Block Polymer Thin Films
Mapping Substrate Surface Field Propagation in Block Polymer Thin Films
复制标题
绘制嵌段聚合物薄膜中的基底表面场传播
DOI：
10.1021/acs.macromol.5b02141
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发表时间：
2016
期刊：
影响因子：
5.5
通讯作者：
Thomas H. Epps
中科院分区：
文献类型：
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作者：
Cameron K. Shelton;Thomas H. Epps
我们通过对 Owens 和 Wendt 界面能量形式的改进方法，分离出了导致嵌段聚合物 (BP) 薄膜中基底表面场效应传播的关键基底-聚合物相互作用。这种修改捕捉到了长程表面能分量对 BP 薄膜中穿膜纳米结构取向的影响，并为操纵 BP 薄膜行为提供了一个框架，而无需进行广泛的参数空间探索。氯硅烷改性基底上的梯度厚度薄膜的光学显微镜（OM）提供了一种高通量方法来确定基底-聚合物界面能量效应的临界传播深度。原子力显微镜 (AFM) 与 OM 相结合，验证自由表面纳米结构随膜厚度的变化。使用模型聚（甲基丙烯酸甲酯-b-n-丙烯酸丁酯）BP 薄膜系统，我们将临界传播深度绘制为界面能量差的函数......
We isolated the key substrate–polymer interactions responsible for the propagation of substrate surface field effects in block polymer (BP) thin films through a modified approach to the Owens and Wendt interfacial energy formalism. This modification captured the influence of long-range surface energy components on through-film nanostructure orientation in BP thin films, and it provides a framework for manipulating BP thin film behavior without the need for extensive parameter space exploration. Optical microscopy (OM) of gradient thickness films on chlorosilane-modified substrates provided a high-throughput approach for identifying the critical propagation depth of substrate–polymer interfacial energy effects. Atomic force microscopy (AFM) was combined with OM to verify changes in free surface nanostructure as a function of film thickness. Using a model poly(methyl methacrylate-b-n-butyl acrylate) BP thin films system, we mapped the critical propagation depth as a function of interfacial energy difference...