Conductive and semi-transparent Cu thin film fabricated using molecular precursor solutions

Conductive and semi-transparent Cu thin film fabricated using molecular precursor solutions
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使用分子前驱体溶液制备导电半透明铜薄膜

DOI:
10.1016/j.matlet.2014.11.056
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发表时间:
2015
期刊:
影响因子:
3
通讯作者:
T. Honda and M. Sato
T. Honda and M. Sato
中科院分区:
材料科学3区
文献类型:
--
作者:
H. Nagai;S. Mita;I. Takano;T. Honda and M. Sato

文献摘要

相似文献

通过溶液工艺在玻璃基板上沉积厚度为 40 nm、拉伸强度为 36 MPa 的半透明 Cu 薄膜,通过在 350 °C 下以 1.5 L min−1 的速率流动 Ar 气体对旋涂前体薄膜进行热处理。 Cu薄膜超过约。在可见光区域具有 30% 的透明度,在红外区域具有 40−100% 的反射率。 Cu薄膜的电阻率为4.7(6)×10−5Ω cm。
A semi-transparent Cu thin film with a thickness of 40 nm and a tensile strength of 36 MPa onto the glass substrate deposited through a solution-based process, by heat-treating the spin-coated precursor film at 350 °C with Ar gas flowing at a rate of 1.5 L min−1. The Cu thin film is more than ca. 30% transparent in the visible region and exhibits 40−100% reflectance in the infrared region. The electrical resistivity of the Cu thin film is 4.7(6)×10−5Ω cm.