A Framework for Boundary-Scan Based System Test and Diagnosis
A Framework for Boundary-Scan Based System Test and Diagnosis
复制标题
基于边界扫描的系统测试和诊断框架
DOI：
10.1109/test.1992.527927
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发表时间：
1992
期刊：
影响因子：
--
通讯作者：
C. W. Yau
中科院分区：
文献类型：
--
作者：
N. Jarwala;P. Stiling;E. Tammaru;C. W. Yau
本文提出了一种测试和诊断在系统，TEM，IEEE标准1149.1兼容板的框架。它定义了用于描述、存储、执行测试、执行诊断的机制，以及与系统诊断专家的接口。使用BIST和边界扫描在系统内可以实现高测试质量，与电路板测试期间实现的测试质量相当。还可以提高诊断的准确性和分辨率。
This paper proposes a framework for testing and diagnosing in-sys,tem, IEEE Std 1149.1 compliant boards. It defines the mechanisms used to describe, store, execute the tests, perform diagnosis, and the interface to the system diagnostician. Using, BIST and Boundary-Scan in-system makes it possible to achieve high test quality, comparable to that achieved during board test. Diagnostic accuracy and resolution can also be enhanced.